English
Detailed Translations for Test Access Port from English to Spanish
Test Access Port:
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the Test Access Port (TAP)
– A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins, TCK/clock, TMS/mode select, TDI/data in, TDO/data out, and TRST/reset. 1
Translation Matrix for Test Access Port:
| Not Specified | Related Translations | Other Translations |
| TAP | TAP; Test Access Port | |
| Test Access Port | TAP; Test Access Port |